Double-redundant design methodology to improve radiation hardness in pixel detector readout ICs
Contributo in Atti di convegno
Data di Pubblicazione:
2015
Citazione:
Double-redundant design methodology to improve radiation hardness in pixel detector readout ICs / L. Frontini, V. Liberali, S.R. Shojaii, A. Stabile - In: 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)Piscataway : NJ IEEE, 2015 Dec. - ISBN 9781509002467. - pp. 396-399 (( convegno IEEE Conference on Electronics, Circuits, and Systems (ICECS) tenutosi a Cairo nel 2015.
Abstract:
This paper proposes a new design method to enhance the radiation hardness of circuits for the next generation of pixel detectors in High Energy Physics experiments. The approach is based on Radiation Hardness By Design methodology to mitigate Single Event Effects. In particle detectors, front-end electronics opeates in an environment characterized by a high dose of radiation. We propose a set of digital cells specifically designed to tolerate a high level of radiation (up to 1 Grad). The cells have been designed in 65 nm CMOS technology. Simulation results show the complete functionality up to 1 Grad of total dose of radiation. The first prototype chip has been designed and submitted for fabrication under the Istituto Nazionale di Fisica Nucleare (INFN) CHIPIX65 project.
Tipologia IRIS:
03 - Contributo in volume
Keywords:
Electrical and Electronic Engineering
Elenco autori:
L. Frontini, V. Liberali, S.R. Shojaii, A. Stabile
Link alla scheda completa:
Titolo del libro:
2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)