Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
Articolo
Data di Pubblicazione:
2020
Citazione:
Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays / A. Niozu, Y. Kumagai, T. Nishiyama, H. Fukuzawa, K. Motomura, M. Bucher, Y. Ito, T. Takanashi, K. Asa, Y. Sato, D. You, Y. Li, T. Ono, E. Kukk, C. Miron, L. Neagu, C. Callegari, M.D. Fraia, G. Rossi, D.E. Galli, T. Pincelli, A. Colombo, T. Kameshima, Y. Joti, T. Hatsui, S. Owada, T. Katayama, T. Togashi, K. Tono, M. Yabashi, K. Matsuda, C. Bostedt, K. Nagaya, K. Ueda. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 1412:20(2020), pp. 202028.1-202028.2. ((Intervento presentato al convegno 31st International Conference on Photonic, Electronic and Atomic Collisions, ICPEAC 2019 tenutosi a Deauville International Conference Centre, fra nel 2019 [10.1088/1742-6596/1412/20/202028].
Abstract:
We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.
Tipologia IRIS:
01 - Articolo su periodico
Elenco autori:
A. Niozu, Y. Kumagai, T. Nishiyama, H. Fukuzawa, K. Motomura, M. Bucher, Y. Ito, T. Takanashi, K. Asa, Y. Sato, D. You, Y. Li, T. Ono, E. Kukk, C. Miron, L. Neagu, C. Callegari, M.D. Fraia, G. Rossi, D.E. Galli, T. Pincelli, A. Colombo, T. Kameshima, Y. Joti, T. Hatsui, S. Owada, T. Katayama, T. Togashi, K. Tono, M. Yabashi, K. Matsuda, C. Bostedt, K. Nagaya, K. Ueda
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