Data di Pubblicazione:
1991
Citazione:
Surface X-ray dichroism of rare-earths / M. Sacchi, O. Sakho, F. Sirotti, X. Jin, G. Rossi. - In: SURFACE SCIENCE. - ISSN 0039-6028. - 251-252:C(1991), pp. 346-349. ((Intervento presentato al 11. convegno European Conf on surface sciece tenutosi a Salamanca nel 1990.
Abstract:
The two-dimensional nature of surface adsorbate layers of rare earth atoms and of epitaxial interfaces of rare earths on Si(111)-7 x 7 is reflected in the axial symmetry of the local field at the rare earth site. The induced splitting of the ground state of the rare earth is probed by linear polarized X-ray absorption spectroscopy (XAS), which exhibits strong dichroism.
Tipologia IRIS:
01 - Articolo su periodico
Keywords:
Physical and Theoretical Chemistry; Condensed Matter Physics; Surfaces and Interfaces
Elenco autori:
M. Sacchi, O. Sakho, F. Sirotti, X. Jin, G. Rossi
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