Interface magnetization profiling by x-ray magnetometry of marker impurities on Fe/GaAs(001)-(4x6)

Articolo
Data di Pubblicazione:
2005
Citazione:
Interface magnetization profiling by x-ray magnetometry of marker impurities on Fe/GaAs(001)-(4x6) / L. Giovanelli, G. Panaccione, G. Rossi, M. Fabrizioli, C.S. Tian, P.L. Gastelois, J. Fujii, C.H. Back. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 87:4(2005), pp. 042506.1-042506.3.
Abstract:
We use Co atoms dispersed in a ferromagnetic Fe film as a magnetic marker material to probe the magnetic properties of the Fe film grown epitaxially on GaAs (001) - (4×6). X-ray magnetic circular dichroism on Co L2,3 edges has been used to perform, in a Mössbauer-like experiment, a layer-dependent analysis. We find an enhancement of the Co orbital magnetic moment near the interface with the GaAs substrate, as well as a decrease of the spin magnetic moment when approaching the interface and at the surface of the Fe film.
Tipologia IRIS:
01 - Articolo su periodico
Keywords:
Substrate surface reconstruction; FE; GAAS(001); anisotropy; dichroism; films; spectroscopy; cobalt
Elenco autori:
L. Giovanelli, G. Panaccione, G. Rossi, M. Fabrizioli, C.S. Tian, P.L. Gastelois, J. Fujii, C.H. Back
Autori di Ateneo:
ROSSI GIORGIO ( autore )
Link alla scheda completa:
https://air.unimi.it/handle/2434/555328

Aree Di Ricerca

Settori


Settore FIS/03 - Fisica della Materia