Data di Pubblicazione:
2006
Citazione:
Strategies for quantification of light elements in minerals by SIMS : H, B and F / L. Ottolini, F. Cámara, F.C. Hawthorne. - In: MIKROCHIMICA ACTA. - ISSN 0026-3672. - 155:1-2(2006 Sep), pp. 229-233.
Abstract:
Using a large set of silicate crystals, characterized by Structure REFinement (SREF), Electron Probe Micro-Analysis (EPMA) and Secondary Ion Mass Spectrometry (SIMS), and mounted with known crystallographic orientation [1], we propose a new SIMS quantification for H, B and F (from ppm level to several wt.%), using 27Al+ and 44Ca+, in turn, as the reference isotope for the matrix, and propose suitable calibration standards to obtain accurate results. The final SIMS data are then compared to those obtained using Si as the reference element, with those available from EMPA (B and F), and with the crystallographic constraints derived from SREF investigation. The results of this study can be extended to the measurement of light elements in complex silicate or non-silicate samples.
Tipologia IRIS:
01 - Articolo su periodico
Keywords:
Calibration procedures; Crystallographic orientation; Light and volatile elements; Silicates; SIMS; Analytical Chemistry
Elenco autori:
L. Ottolini, F. Cámara, F.C. Hawthorne
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