A new particle sizing technique based on near field scattering

We present a novel technique for particle sizing based on recent studies about the statistical information contained within the light intensity distribution close to a disordered sample. We show that it is much simpler and more robust than the traditional light scattering methods and any imaging technique. Applications to optical diagnostics, process monitoring and pollution monitoring are expected. In principle, since the basic phenomenon is wavelength independent, radiation other than visible light can be used.