Exploiting volume electron microscopy to investigate structural plasticity and stability of the postsynaptic compartment of central synapses
Articolo
Data di Pubblicazione:
2023
Citazione:
Exploiting volume electron microscopy to investigate structural plasticity and stability of the postsynaptic compartment of central synapses / G. Maiellano, L. Scandella, M. Francolini. - In: FRONTIERS IN CELLULAR NEUROSCIENCE. - ISSN 1662-5102. - 17:(2023), pp. 1153593.1-1153593.6. [10.3389/fncel.2023.1153593]
Abstract:
Volume reconstruction from electron microscopy datasets is a tool increasingly
used to study the ultrastructure of the synapse in the broader context of neuronal
network and brain organization. Fine modifications of synapse structure, such
as activity-dependent dendritic spine enlargement and changes in the size and
shape of the postsynaptic density, occur upon maturation and plasticity. The
lack of structural plasticity or the inability to stabilize potentiated synapses are
associated with synaptic and neuronal functional impairment. Mapping these
rearrangements with the high resolution of electron microscopy proved to
be essential in order to establish precise correlations between the geometry
of synapses and their functional states. In this review we discuss recent
discoveries on the substructure of the postsynaptic compartment of central
excitatory synapses and how those are correlated with functional states of the
neuronal network. The added value of volume electron microscopy analyses with
respect to conventional transmission electron microscopy studies is highlighted
considering that some limitations of volume-based methods imposed several
adjustments to describe the geometry of this synaptic compartment and new
parameters–that are good indicators of synapses strength and activity–have
been introduced.
Tipologia IRIS:
01 - Articolo su periodico
Keywords:
volume electron microscopy (vEM); postsynaptic density (PSD); structural plasticity; dendritic spine enlargement; axon-spine interface; synaptic apposition surface; synapse;
synaptic stability
Elenco autori:
G. Maiellano, L. Scandella, M. Francolini
Link alla scheda completa:
Link al Full Text: