Two-dimensional electron beam diagnostics with X-ray heterodyne near field speckles

In this work we report on recent two-dimensional (2D) electron beam diagnostics at the NCD-SWEET undulator beamline at the ALBA Synchrotron Light Source with a novel interferometric technique based on X-ray Heterodyne Near Field Speckles. We show that the method is intrinsically 2D and can resolve beam sizes as small as 5 μm. We also discuss relevance to future fourth-generation light sources near the diffraction limit.