Quantitative nanofriction characterization of corrugated surfaces by atomic force microscopy
Articolo
Data di Pubblicazione:
2004
Citazione:
Quantitative nanofriction characterization of corrugated surfaces by atomic force microscopy / A. Podestà, G. Fantoni, P. Milani. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 75:5(2004), pp. 1228-1242.
Abstract:
Atomic force microscopy (AFM) is a suitable tool to perform tribological characterization of
materials down to the nanometer scale. An important aspect in nanofriction measurements of
corrugated samples is the local tilt of the surface, which affects the lateral force maps acquired with
AFM. This is one of the most important problems of state-of-the-art nanotribology, hampering a
reliable and quantitative characterization of real corrugated surfaces. In this article, we present a
solution to the problem of the topographic correction of AFM lateral force maps acquired on
corrugated samples in the presence of adhesion. We apply it in the specific case of multiasperity
adhesive contacts, which are of common occurrence at many interfaces of technological interest.We
discuss the validity and limitations of our approach.
Tipologia IRIS:
01 - Articolo su periodico
Keywords:
Friction ; atomic force microscopy ; surface topography ; adhesion ; micromechanics
Elenco autori:
A. Podestà, G. Fantoni, P. Milani
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