Data di Pubblicazione:
2016
Citazione:
Characterization and volume test of the AM06 chip / S.R. Shojaii, A. Annovi, D. Banfi, M. Beretta, F. Crescioli, L. Frontini, V. Liberali, L. Marcellino, A. Stabile - In: New Perspectives in Measurements, Tools and Techniques for Systems Reliability, Maintainability and Safety[s.l] : IMEKO-International Measurement Federation Secretariat, 2016 Jun. - pp. 32-35 (( Intervento presentato al 14. convegno New Perspectives in Measurements, Tools and Techniques for Systems Reliability, Maintainability and Safety tenutosi a Milano nel 2016.
Abstract:
This paper presents a methodology for the characterization and the industrial testing of a very complex Application-Specific Integrated Circuit (ASIC). The proposed test system is being installed at a company and it is very user friendly also for a non specialized operator. This framework has been developed within a collaboration by the Istituto Nazionale di Fisica Nucleare (INFN) and the Laboratoire de Physique Nucléaire et de Hautes Energies (LPNHE), and the same test setup is installed in the laboratories of INFN-Milan, INFN-Frascati and LPNHE-Paris.
Tipologia IRIS:
03 - Contributo in volume
Keywords:
Industrial and Manufacturing Engineering
Elenco autori:
S.R. Shojaii, A. Annovi, D. Banfi, M. Beretta, F. Crescioli, L. Frontini, V. Liberali, L. Marcellino, A. Stabile
Link alla scheda completa:
Titolo del libro:
New Perspectives in Measurements, Tools and Techniques for Systems Reliability, Maintainability and Safety