Evaluating the impact of substrate noise on conducted EMI in automotive microcontrollers
Contributo in Atti di convegno
Data di Pubblicazione:
2013
Citazione:
Evaluating the impact of substrate noise on conducted EMI in automotive microcontrollers / M. Cazzaniga, P. Joubert Doriol, A. Sanna, E. Blanc, V. Liberali, D. Pandini - In: Proceedings of the 9. international workshop
on electromagnetic compatibility of integrated circuits : EMC COMPO 2013 : Nara, Japan / [a cura di] Y. Toyota, K. Iokibe, T. Matsushima, O. Wada. - [s.l] : IEEE, 2013 Dec. - ISBN 978-1-4799-2315-1. - pp. 129-133 (( Intervento presentato al 9. convegno International workshop on electromagnetic compatibility of integrated circuits : EMC Compo tenutosi a Nara, Japan nel 2013 [10.1109/EMCCompo.2013.6735186].
Abstract:
Board-level I/Os signal integrity and conducted EMI have become a critical concern for high-speed circuit and package designers, and a major element of performance and reliability degradation in modern electronic systems, in particular for automotive microcontrollers, which must satisfy stringent low-EMI and noise immunity requirements. One of the most detrimental root causes of I/O signals conducted EMI is the simultaneous switching noise generated by the toggling I/Os (SSO) on the power distribution network of the I/O ring. However, this is not the only noise source that must be considered. In fact, an often overlooked contributor to SSO is the noise generated by the switching digital core that propagates to the I/Os and the noise-sensitive on-chip analog circuitry throughout the common silicon substrate. In this work, we analyze the impact of substrate noise on the I/O signals conducted EMI of an industrial automotive microcontroller, and we compare it against other noise sources. Moreover, we demonstrate the effectiveness of the technological protections against substrate noise in a leading-edge technology.
Tipologia IRIS:
03 - Contributo in volume
Keywords:
automotive microcontroller; conducted EMI; I/O ring; noise integrity; signal integrity; simultaneous switching output noise (SSO); Substrate noise; System-on-Chip
Elenco autori:
M. Cazzaniga, P. Joubert Doriol, A. Sanna, E. Blanc, V. Liberali, D. Pandini
Link alla scheda completa:
Titolo del libro:
Proceedings of the 9. international workshop
on electromagnetic compatibility of integrated circuits : EMC COMPO 2013 : Nara, Japan
on electromagnetic compatibility of integrated circuits : EMC COMPO 2013 : Nara, Japan