Fault-tolerance in micro programmed control : architectures & schematic synthesis
Contributo in Atti di convegno
Data di Pubblicazione:
2005
Citazione:
Fault-tolerance in micro programmed control : architectures & schematic synthesis / S. Demidenko, E. Levine, V. Piuri, G. Sen Gupta - In: 2005 IEEE instrumentation and measurement technology conference : IMTC 2005 : Ottawa, Ontario, Canada, 16-19 may 2005. 1. / [a cura di] E. Petriu ... [et al.]. - Piscataway : Institute of electrical and electronics engineers, 2005. - ISBN 0780388798. - pp. 305-310 (( Intervento presentato al 22. convegno IEEE Instrumentation and Measurement Technology Conference (IMTC) tenutosi a Ottawa, Canada nel 2005 [10.1109/IMTC.2005.1604123].
Abstract:
The paper deals with architectural and schematic design of concurrently (on-line) self-checking Micro Program Control Units. The checking is organised by using a special check keys added to each microinstruction. The sequence of keys appearing on the output of MPCU during the program execution is then monitored. It allows checking the control flow by comparing the actual sequence of the check keys against a reference sequence corresponding to fault-free operation of MPCU. Three main architectures discussed in the paper are: a) based on the use of Compression-in-Space of the check keys; b) based on implementation of Compression-in-Space & Compression-in-Time; and c) Compression & Generation check keys -based. The design procedure for the checking circuitry based on the use of Compression & Generation is discussed in the paper for two types of the check key generators: a standard one (for example, M-sequence generator) and an unique generator (specially synthesised sequential automata producing some required digital sequence).
Tipologia IRIS:
03 - Contributo in volume
Keywords:
Architectural and schematic implementations ; Check key generation and compression ; Microprogram control unit ; Program flow monitoring.
Elenco autori:
S. Demidenko, E. Levine, V. Piuri, G. Sen Gupta
Link alla scheda completa:
Titolo del libro:
2005 IEEE instrumentation and measurement technology conference : IMTC 2005 : Ottawa, Ontario, Canada, 16-19 may 2005. 1.