Data di Pubblicazione:
2008
Citazione:
PIXE and XRF analysis of particulate matter samples : an inter-laboratory comparison / G. Calzolai, M. Chiari, F. Lucarelli, F. Mazzei, S. Nava, P. Prati, G. Valli, R. Vecchi. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS. - ISSN 0168-583X. - 266:10(2008), pp. 2401-2404.
Abstract:
PIXE and XRF are very effective techniques in atmospheric aerosol investigation, therefore they are extensively used by the authors. In this work an inter-laboratory comparison of the results obtained analysing several samples (collected on different substrata) with both techniques is presented: the samples were analysed by PIXE (in Florence, at the 3 MV Tandetron accelerator of LABEC laboratory) and by XRF (in Genoa and Milan, where two Oxford XRF instruments are operational). The results of the three sets of measurements are in good agreement for all the analysed samples.
The aim of this work was also to compare PIXE and XRF performance in atmospheric aerosol analysis with the routine set-up currently in use at the three laboratories, to determine the best technique to be applied depending on the substratum used for aerosol sampling and the main elements of interest for each specific research project. Results of the comparison between the minimum detection limits of both techniques will be shown for all the measured elements, for different substrata (Teflon, polycarbonate and cellulose mixed esters).
Tipologia IRIS:
01 - Articolo su periodico
Keywords:
PIXE ; XRF ; aerosol ; MDL
Elenco autori:
G. Calzolai, M. Chiari, F. Lucarelli, F. Mazzei, S. Nava, P. Prati, G. Valli, R. Vecchi
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