Time-resolved HAXPES using a microfocused XFEL beam : From vacuum space-charge effects to intrinsic charge-carrier recombination dynamics
Articolo
Data di Pubblicazione:
2016
Citazione:
Time-resolved HAXPES using a microfocused XFEL beam : From vacuum space-charge effects to intrinsic charge-carrier recombination dynamics / 2. Lars Philip Oloff1, A. Chainani, M. Matsunami, K. Takahashi, T. Togashi, H. Osawa, K. Hanff, A. Quer, R. Matsushita, R. Shiraishi, M. Nagashima, A. Kimura, K. Matsuishi, M. Yabashi, Y. Tanaka, G. Rossi, T. Ishikawa, K. Rossnagel, A.M. Oura. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - 2016:6(2016 Oct 12), pp. 35087.1-35087.10. [10.1038/srep35087]
Abstract:
Time-resolved hard X-ray photoelectron spectroscopy (trHAXPES) using microfocused X-ray free-electron laser (XFEL, hν = 8 keV) pulses as a probe and infrared laser pulses (hν = 1.55 eV) as a pump is employed to determine intrinsic charge- carrier recombination dynamics in La:SrTiO3. By means of a combination of experiments and numerical N-body simulations, we first develop a simple approach to characterize and decrease XFEL-induced vacuum space-charge effects, which otherwise pose a serious limitation to spectroscopy experiments. We then show that, using an analytical mean-field model, vacuum space-charge effects can be counteracted by pump laser-induced photoholes at high excitation densities. This provides us a method to seperate vacuum space-charge effects from the intrinsic charge-carrier recombination dynamics in the time domain. Our trHAXPES results thus open a route to studies of intrinsic charge-carrier dynamics on picosecond time scales with lateral spatial resolution on the micrometer scale.
Tipologia IRIS:
01 - Articolo su periodico
Keywords:
X-ray Fere Electron laser, Bulk Photoemission, Time Resolved Spectrocsopy on Solids
Elenco autori:
2. Lars Philip Oloff1, A. Chainani, M. Matsunami, K. Takahashi, T. Togashi, H. Osawa, K. Hanff, A. Quer, R. Matsushita, R. Shiraishi, M. Nagashima, A. Kimura, K. Matsuishi, M. Yabashi, Y. Tanaka, G. Rossi, T. Ishikawa, K. Rossnagel, A.M. Oura
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