Data di Pubblicazione:
2013
Citazione:
Fixed Energy X‑ray Absorption Voltammetry / A. Minguzzi, O. Lugaresi, C. Locatelli, S. Rondinini, F. D’Acapito, E. Achilli, P. Ghigna. - In: ANALYTICAL CHEMISTRY. - ISSN 0003-2700. - 85:15(2013 Jul 16), pp. 7009-7013. [10.1021/ac401414v]
Abstract:
In this paper, the fixed energy X-ray absorption voltammetry (FEXRAV) is introduced. FEXRAV represents a novel
in situ X-ray absorption technique for fast and easy preliminary
characterization of electrode materials and consists of recording the
absorption coefficient at a fixed energy while varying at will the
electrode potential. The energy is chosen close to an X-ray
absorption edge, in order to give the maximum contrast between
different oxidation states of an element. It follows that any shift
from the original oxidation state determines a variation of the
absorption coefficient. Although the information given by FEXRAV obviously does not supply the detailed information of X-ray absorption near edge structure (XANES) or extended X-ray absorption fine structure (EXAFS), it allows to quickly map the
oxidation states of the element under consideration within the selected potential windows. This leads to the rapid screening of several systems under different experimental conditions (e.g., nature of the electrolyte, potential window) and is preliminary to more deep X-ray absorption spectroscopy (XAS) characterizations, like XANES or EXAFS. In addition, the time-length of the experiment is much shorter than a series of XAS spectra and opens the door to kinetic analysis.
Tipologia IRIS:
01 - Articolo su periodico
Elenco autori:
A. Minguzzi, O. Lugaresi, C. Locatelli, S. Rondinini, F. D’Acapito, E. Achilli, P. Ghigna
Link alla scheda completa: