Balanced redundancy utilization in embedded memory cores for dependable systems
Contributo in Atti di convegno
Data di Pubblicazione:
2002
Citazione:
Balanced redundancy utilization in embedded memory cores for dependable systems / M. Choi, N. Park, F. Lombardi, Y. Kim, V. Piuri - In: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings.[s.l] : IEEE, 2002. - ISBN 0-7695-1831-1. - pp. 419-427 [10.1109/DFTVS.2002.1173540]
Tipologia IRIS:
03 - Contributo in volume
Elenco autori:
M. Choi, N. Park, F. Lombardi, Y. Kim, V. Piuri
Link alla scheda completa:
Titolo del libro:
17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings.