Data di Pubblicazione:
1998
Citazione:
Testability analysis and behavioral testing of the Hopfield neural paradigm / C. Alippi, F. Fummi, V. Piuri, M. Sami, D. Sciuto. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - 6:3(1998), pp. 507-511.
Abstract:
Testability analysis and test pattern generation for neural architectures can be performed at a very high abstraction level on the computational paradigm. In this paper, we consider the case of Hopfield's networks, as the simplest example of networks with feedback loops. A behavioral error model based on finite-state machines (FSM's) is introduced. Conditions for controllability, observability and global testability are derived to verify errors excitation and propagation to outputs. The proposed behavioral test pattern generator creates the minimum length test sequence for any digital implementation.
Tipologia IRIS:
01 - Articolo su periodico
Keywords:
Hopfield neural nets ; Controllability ; Finite state machines ; Observability ; Testing.
Elenco autori:
C. Alippi, F. Fummi, V. Piuri, M. Sami, D. Sciuto
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