Data di Pubblicazione:
2018
Citazione:
Growth Mechanism of Cluster-Assembled Surfaces : From Submonolayer to Thin-Film Regime / F. Borghi, A. Podestà, C. Piazzoni, P. Milani. - In: PHYSICAL REVIEW APPLIED. - ISSN 2331-7019. - 9:4(2018 Apr 11). [10.1103/PhysRevApplied.9.044016]
Abstract:
Nanostructured films obtained by assembling preformed atomic clusters are of strategic importance for a wide variety of applications. The deposition of clusters produced in the gas phase onto a substrate offers the possibility to control and engineer the structural and functional properties of the cluster-assembled films. To date, the microscopic mechanisms underlying the growth and structuring of cluster-assembled films are poorly understood, and, in particular, the transition from the submonolayer to the thin-film regime is experimentally unexplored. Here we report the systematic characterization by atomic force microscopy of the evolution of the structural properties of cluster-assembled films deposited by supersonic cluster beam deposition. As a paradigm of nanostructured systems, we focus our attention on cluster-assembled zirconia films, investigating the influence of the building block dimensions on the growth mechanisms and roughening of the thin films, following the growth process from the early stages of the submonolayer to the thin-film regime. Our results demonstrate that the growth dynamics in the submonolayer regime determines different morphological properties of the cluster-assembled thin film. The evolution of the roughness with the number of deposited clusters reproduces the growth exponent of the ballistic deposition in the 2 thorn 1 model from the submonolayer to the thin-film regime.
Tipologia IRIS:
01 - Articolo su periodico
Keywords:
nanostructured cluster-assembled materials; supersonic cluster beam deposition; surface morphology; ballistic deposition; atomic force microscopy; growth mechanisms; submonolayer; thin films
Elenco autori:
F. Borghi, A. Podestà, C. Piazzoni, P. Milani
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