Recent developments on the rapid screening of electrocatalysts by scanning electrochemical microscopy
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Data di Pubblicazione:
2010
Citazione:
Recent developments on the rapid screening of electrocatalysts by scanning electrochemical microscopy / A. Minguzzi, D. Battistel, C. Locatelli, J. Rodriguez Lopez, A. Vertova, S. Daniele, S. Rondinini, A.J. Bard. ((Intervento presentato al 61. convegno Annual Meeting of the International Society of Electrochemistry tenutosi a Nice nel 2010.
Abstract:
Scanning Electrochemical Microscopy is a scanning probe technique which is
becoming a leading electrochemical technique. The possibility of using a movable
microelectrode which can be scanned over a surface is one of the most attractive
features. In turn, the substrate can assume different natures, from biological systems to
electrocatalytic surface, from photoactive materials to nanostructured textures, thus
making the technique extremely flexible.
In the most recent years, SECM is being applied to study libraries of materials useful as
electrocatalysts or photoelectrocatalysts in energy conversion devices
1-3
.
In this work, recent results on the rapid screening of electrochemical activity of
material libraries toward the oxygen evolution/reduction reactions are shown and
discussed.
The effectiveness of these methods is proved by digital simulations.
Both methods were applied on model mixtures based on the Ir-O system, considered as
promising materials for the preparation of operative devices.
Experimental results obtained by SECM are confirmed by voltamperometric and
physico-chemical techniques.
1. Férnandez J.L.,. Walsh D. A, Bard A.J., J. Am. Chem. Soc. 2005, 127, 357-365
2. Minguzzi, A.; Apulche-Aviles, M. A.; Rodriguez Lopez, J.; Rondinini, S.; Bard, A.J.
Anal. Chem. 2008, 80, 4055.
3 Lee J., Ye H., Pan S., Bard A. J., Anal. Chem. 2008, 80, 7445
Tipologia IRIS:
14 - Intervento a convegno non pubblicato
Elenco autori:
A. Minguzzi, D. Battistel, C. Locatelli, J. Rodriguez Lopez, A. Vertova, S. Daniele, S. Rondinini, A.J. Bard
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